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Overview of Research Facilities

Overview of Research Facilities
Address: 11-1, 9-chome, Kameido, Koto-ku, Tokyo, 136-8515
Telephone: +81-3-3636-8111
Site area: 9,999 m2
Building area: 1,988 m2
Total floor area: 7,136 m2
Number of stories (above ground): Research Building: 5; Applications Building: 2;
Battery Building: 2
Height of buildings: Research Building: 31 m; Applications Building: 10 m;
Battery Building: 6.6 m
Equipment:

neutralizing equipment, special gas equipment, other
Other facilities: each factory has an intermediate testing facility (Fukushima No.1 Factory: electronic materials; Fukushima No.2 Factory: organic; Nishiyodogawa Factory: inorganic)
Analytical equipment: Scanning electron microscope (SEM), transmission electron microscope (TEM), SEM-EDX, scanning probe microscope (SPM), X-ray scanning analytical microscope (XSAM), X-ray diffractometer, X-ray analyzer with ramp-temperature function, magnetic resonance spectrometer (H, C, P and other), mass spectrometers (GC and LC), X-ray fluorescence (XRF), ICP-atomic emission spectroscopy (ICP-AES), thermal analysis, other
   
GC, LC-mass spectrometer
     
Purpose: qualitative and quantitative analysis of organic components in trace amounts

A high-sensitivity, high-resolution, high-speed scanning time-of-flight-mass-spectrometer capable of measuring the molecular weight of organic compounds.
Even slight differences in molecular weight can be detected through precise mass analysis, e.g. the mass of CO, 27.99491, can be distinguished from that of N2, 28.00615.
Samples in any phase, liquid, solid, or gas, can be analyzed by utilizing the JMS-T100GC, which is equipped with a gas chromatography system, or the JMS-T100LP, which is equipped with a liquid chromatography system.
Furthermore, mass spectrometry systems such as the quadrupole GC-MS system and ion trap LC-MS are also used, depending on the purpose of the analysis.
ICP-mass spectrometry
Purpose: qualitative and quantitative analysis of ultra-low quantity components in aqueous solution

The system is capable of measuring elemental content at ultra-low concentrations, such as ppb (parts per billion) and ppt (parts per trillion).
ICP-mass spectrometry was previously not used on samples with strongly interfering components; however, the system is now equipped with an interference cancellation system, allowing measurement of such samples.
In order to avoid contamination, ultra-pure water, purified within the same clean booth, is used for final dilution of the sample liquid.
For samples in larger amounts, for which use of ICP-mass spectrometry is not considered necessary, ICP-AES and atomic absorption spectroscopy are used.
FE-electron probe micro analyzer
Purpose: measurement of micro part and trace element distribution

By combining SEM (which allows observation of magnified micro parts) with XRF (which allows measurement of the constituent elements), the elemental distribution and elemental content in a small area, of the order of microns, can be observed in the form of images.
This FE-EPMA system in particular conforms to the world´s highest standards, and is equipped with an FE electron gun in the microscope section.
Please refer to the article in “CREATIVE Vol. 7” for a description of the FE-EPMA.
Scanning electron microscope
     
Purpose: observation and elemental analysis of micro parts

This high resolution system is equipped with a cold FE electron gun, which easily allows observation at a magnification of several hundred of thousand. The system is also equipped with an elemental analysis device, which allows elemental analysis and mapping of the images under observation.
X-ray diffractometer
     

Purpose: analysis of crystallographic structure

The X-ray diffractometer allows analysis of the crystallinity of a powder and of the structure of the corresponding crystal. Equipped with a high-efficiency detector, highly precise results can be obtained in a short space of time (Bruker D8 ADVANCE/V).
Growth of crystals at different temperatures can also be studied by controlling the temperature (PANalytical X´Pert-MPD).

If the elements constituting the material are of interest (qualitative analysis) rather than the form of the crystal, an XRF analyzer is used.
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